3044907

The Push In Clamp - Wire Entry Angled to Panel system employs low-EMF nickel-plated beryllium copper contacts, reducing thermal voltages to <0.2 V/K. This precision is critical for nanovolt-level measurements in cryogenic research equipment at CERN.

Developed for metrology applications, the Push In Clamp - Wire Entry 90° to Panel options feature gold-over-nickel diffusion barriers that maintain contact resistance stability within 0.5% over 10,000 mating cycles in calibration standards.

With 0.602" (15.30mm) options available, engineers can optimize signal path lengths in atomic clock reference circuits. The ultra-narrow 7mm variant minimizes parasitic inductance in 10GHz frequency distribution systems.

Compatible with 0.039 ~ 0.098" (1.0 ~ 2.5mm) specifications, the mounts adapt to both thin composite radomes and thick aluminum vacuum chamber flanges. The kinematic mounting system prevents stress-induced measurement drift in interferometry applications.

The 2 configuration supports star-quad wiring arrangements essential for rejecting common-mode noise in picoammeter inputs. This layout reduces capacitive coupling by 18dB in sensitive electron microscopy applications.

The Snap Fit incorporates non-magnetic stainless steel hardware for use in MRI equipment. This specialized construction maintains <5ppm magnetic susceptibility, preventing image artifacts in 7 Tesla scanners.

Precision 0.205" (5.20mm) spacing matches impedance requirements for high-speed data acquisition front ends. The PTFE-insulated versions provide stable dielectric constant ( 2%) across humidity variations in weather satellite payloads.

Rated for 300 V operation, the terminals exhibit negligible partial discharge (<5pC) at 90% of rated voltage. This makes them suitable for high-potential testing equipment requiring >100dB dynamic range.

The 25 A capacity utilizes superconducting alloy contacts for cryogenic current comparators. These maintain <0.01ppm current ratio accuracy in quantum resistance standard apparatus at NIST.

Supporting 10-24 AWG ranges, these terminals accommodate both delicate thermocouple leads and heavy current-carrying conductors. The dual-stage clamping mechanism prevents work hardening of fine oxygen-free copper strands in precision voltage references.

The Gray coding follows IEC 60446 standards for laboratory safety systems. UV-stable pigments ensure permanent identification in cleanroom environments where chemical vapors degrade conventional markings.

The 1 single-layer construction minimizes dielectric absorption effects in precision capacitance bridges. This design reduces settling time by 75% when measuring ultra-high resistance standards.