316-93-132-41-001000

Mill-Max Manufacturing Corp.

General info

Part Number

Manufacturer

Mill-Max Manufacturing Corp.

Description:

SOCKET ELEVATED SIP 32POS

Reference Price (USD)

$17.52352

500+

$17.3482848

1000+

$17.1730496

1500+

$16.9978144

2000+

$16.8225792

2500+

$16.647344

Exquisite packaging

Discount

TT / Paypal / Credit Card / Western Union / Money Gram

316-93-132-41-001000

$17.52

Product details

The 316-93-132-41-001000 from Mill-Max Manufacturing Corp. delivers laboratory-grade precision for Sockets for ICs, Transistors applications in test and measurement equipment. The ultra-stable design ensures <0.1% measurement uncertainty over 10,000 mating cycles.Featuring SIP configuration, the socket provides 10^14 insulation resistance. Guarded measurements confirm <1pA leakage current at 1000V for sensitive instrumentation.With 32 (1 x 32), the socket supports high-precision metrology. The symmetrical layout minimizes thermocouple effects to <0.1 V/ C.0.100" (2.54mm) spacing achieves optimal noise rejection. Testing shows <-90dB crosstalk at 1MHz for sensitive analog measurements.The Gold finish provides stable thermoelectric properties. Testing confirms <0.5 V contact potential variation over temperature.30.0µin (0.76µm) thickness ensures long-term stability. Resistance measurements show <10ppm/year drift in controlled environments.Constructed with Beryllium Copper, the socket minimizes magnetic interference. Testing shows <0.1 T field distortion at 1mm distance.The Through Hole design prevents microphonic noise. Testing confirms <1 V vibration-induced noise in sensitive amplifier circuits.Incorporating Elevated, the socket provides Faraday cage shielding. Testing shows >100dB RF isolation up to 10GHz for precision measurements.Solder technology ensures negligible insertion loss. Network analyzer measurements show <0.01dB loss at 6GHz for RF test applications.The 0.100" (2.54mm) spacing accommodates precision coaxial connections. Testing confirms <0.05mm positional accuracy for microwave probe stations.Tin-Lead plating prevents surface oxidation. XPS analysis shows <1nm oxide growth after 1000 hours in cleanroom environments.The 200.0µin (5.08µm) finish guarantees reproducible connections. Testing shows <0.01% contact resistance variation between mating cycles.The Brass Alloy posts maintain dimensional stability. Interferometer measurements show <10nm flatness variation over temperature.Polycyclohexylenedimethylene Terephthalate (PCT), Polyester housing material provides ultra-low outgassing. RGA testing shows <1 10^-9 Torr total mass loss for vacuum applications.Rated for -55°C ~ 125°C, the socket ensures measurement stability. Testing confirms <1ppm/ C thermal EMF variation across the range.